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Metrology and Microscopy

Consulting, Applications Development, Calibration, Sample Preparation

Atomic Force Microscopy, Scanning electron Microscopy, Electron Dispersive Spectroscopy, Cathodolumenescence, White Light Interferometry, Profilometry

25-years of experience

Factory trained on most brands and techniques

"Making meaningful measurements repeatable"

Gary Williams

Tel: 1-209-345-2316



San Francisco Bay Area

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